arXiv cs.CV
· Papers
SAMSEM — A Generic and Scalable Approach for IC Metal Line Segmentation
arXiv:2603.16548v2 Announce Type: replace-cross Abstract: In light of globalized hardware supply chains, the assurance of hardware components has gained significant interest, particularly in cryptographic applications and high-stakes scenarios. Identifying metal lines on scanning electron microscope (SEM) images of int